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> Used hypot ultra ii
Used hypot ultra ii
USED HYPOT ULTRA II MADE BY ASSOCIATED RESEARCH
Feature The first complete systems to include AC, DC, or AC/DC Hipot, and the
Insulation Resistance test into a single 19 inch rack mount cabinet
HypotULTRA II combines the three most common dielectric safety tests (AC
Hipot, DC Hipot & IR test) required by agencies such as UL, CSA, IEC, VDE,
TÃœV, BABT and others into a single instrument which takes up less rack space
and enables a single DUT connection.
Feature Full GPIB (IEEE 488) or RS232 interfaces as standard features
All the functions of the instrument can be programmed over either interface which
makes the instrument adaptable to any type of automated production environment.
Feature The only instruments that offer an optional built-in 8 port scanner and an
interface to control up to two external scanners for expansion capabilities up
to 16 ports (built-in scanner option only available in model 7550DT)
These optional scanner configurations are ideal for multi-point testing of a single
item or multiple product testing. The high voltage outputs of either the internal or
external scanner can be set as high, low or off. A front panel display shows the
status of each scanner output port.
Feature A single 2 x 20 LCD display provides a clear indication of all test results and
This single easy-to-view and simple-to-interpret LCD display allows the operator
Feature All setup parameters can be adjusted through a simple menu driven program
with hot keys to quickly access all functions by using the front panel
The operator is provided with an easy and safe way to set trip currents and output
voltages since all parameters are set without high voltage activated. The easy to
follow menu ensures that the operator correctly sets up each test mode.
A real benefit for manufacturers that test different products. Each setup can store
up to 8 steps which can be configured to perform any of the safety tests. In
addition each setup can be linked to the next for setting up as many as 400 steps in
Feature Patented RAMP HI (U.S. Patent No. 5,828,222) and CHARGE LO (U.S.
Patent No. 5,936,419) testing features allow for more effective DC Hipot
The RAMP HI feature allows the user to set a higher trip rate during the ramp to
allow for quick charging of the product without nuisance tripping thereby
increasing throughput when testing with DC. The CHARGE LO provides the user
with the capability to ensure that the device under test is connected correctly.
Feature Programmable security password system
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